Optical Engineering Software for Optical Design, Illumination, Thin-Films

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OpTaliX^® Software for Optical Design, Thin-Films and Illumination

First 16 modes in fibers.

OpTaliX is a comprehensive program for computer aided design of optical systems, thin film multilayer coatings and illumination systems. OpTaliX provides powerful features to conceptualize, design, optimize, analyze, tolerance and document virtually any optical system. OpTaliX includes geometrical and diffraction analysis, optimization, thin film multilayer analysis and refinement, non-sequential ray trace, physical optics propagation, polarization analysis, ghost imaging, tolerance analysis, extensive manufacturing support, user defined graphics, illumination, macros, and many more. OpTaliX is successfully used for the design of photographic and video lenses, industrial optics (beam expander, laser scanners, reproduction, machine vision), space optics, zoom optics, medical optics, illumination devices, fiber optical telecom systems, infrared optics, X-ray optics, telescopes, eyepieces, and many more.

OpTaliX is tested and certified for Win-XP, Win-7, Win-Vista, Win-8, Win-10, Win-11, for 64-bit operating systems.
OpTaliX is available in three editions, called OpTaliX-Pro, OpTaliX-Edu and OpTaliX-LT.


Support of multiple processors in 64-bit editions from versions 8.xx onwards:

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New Version 12.11:   (31-July-2024)

• A new surface type added: The Xfreeform special surface (SPS XFF) combines the elements (coefficients) of a biconic surface, even polynomial asphere, standard Zernike surface and a XY-polynmial up to 20th order.
• The LM optimization now accepts default constraints.
• New commands and options added for optimization: 'SIL' switches to silent mode in the optimization, i.e. any output is suppressed. The commands "DEL VAR ALL" and "DEL VARZ ALL" now allow deletion of all optimization variables in one go.
• New command added: GHRSI trace a single ghost ray. This coomand is a complment to the RSI command, however, GHRSI takes the double reflections in typical ghost paths into account.
• New lens database items added: GHX, GHY, GHZ return the surface coordinates of a ghost ray,
• Minor changes.

Download version 12.11.
Version history

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Key Features of OpTaliX-PRO/EDU

Sequential and non-sequential ray tracing Zoom and multi-configuration systems Thin-film multilayer analysis and refinement Advanced optimization algorithms with exact constraints handling Polarization Analysis Illumination Analysis Tolerance analysis (Tolerance on anything) Full geometrical and diffraction analysis Macro language with variables, loops, conditional constructs, user-defined functions, etc. Environmental analysis

Wide range of surface types such as aspheres, spline, holograms, free-form surfaces, Zernike, user-defined surfaces and GRIN's, etc. Interferogram analysis User-defined graphics Manufacturing Support Slider control ISO-10110 element drawings More than 500 example designs Complete glass catalogs (1600+ glasses) plus lens catalogs (8000+ lenses) from all major vendors

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Overview

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• Why OpTaliX
• Feature Summary
• File Conversion

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Examples

• Non-Sequential
  
• Special Apertures
• Gradient Index
• Hologram
• Zoom
• Array Surfaces
• Fresnel Lens
• Light Pipe
• Global References
• Geometric Analysis
• Diffraction Analysis
• Interferogram
• Physical Optics (350kb)
• Fibers
• Optimization
• User Defined Graphics
• Glass Manager
• Coatings
• Macro Language
• ISO Element Drawing
• Surface Deformations
• Ghost Image Analysis
• Illumination

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   Website Updated:
    31-July-2024