Software for Optical Design, Illumination, Thin-Films

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OpTaliX Version History

Version 12.00
Changes in version 12.00:

  • Definition of optimization targets is now also possible from the command line and in macros using the TAR and DEL TAR commands. Previously, the targets could only be defined in a Windows dialog.
  • Macro equation parser fails where the exponent is given in E+000 format. Previously, only the E+00 format (two digits in the exponent) was accepted.
  • In thin film multilayer analysis the complex index of the material "air" was wrong. Now corrected.
  • Illumination analysis: In the RGB analysis plot (true colour) the assignment of system wavelengths to RGB colours has been corrected. Previously the colour rendition in this plot did not match the input data.
  • A bug in the raytrace of Zernike surfaces has been fixed.
  • The fidelity of thermal analysis has been improved: Now also hologram parameters, like grating frequency, diffraction phase and blaze depth, are appropriately scaled in the thermal modelling.
  • The optimization parameter dialog (invoked by EDI OPT) is now modeless, that is, it can stay permanently open and it is therefore more easy and faster to access the optimization settings.
  • The optimization iteration can now be prematurely stopped, e.g. by a "Terminate OPT" button, which is available in the (now permanently open) optimization parameter dialog and can be pressed any time during the optimization process. This may be very useful if iterations do not converge sufficiently, an optimization is ill-conditioned or the iteration steps take too much time.
  • A global optimization algorithm has been added. It is based on the "escape function" proposed by Masaki Isshiki.
  • Minor changes.

Version 11.91
Changes in version 11.91:

  • The thermal analysis has been extended: It now also supports the thermal change of zoom/multiconfiguration parameters.
  • The analysis options Through Focus Spot and Through Focus MTF now allow definition of the number of defocus intervals. This alows a finer representation of the through focus effects. Previously, only 21 defocus intervals were allowed.
  • The conversion of external AGF glass catalogues now includes the internal transmission of glasses, if in the wavelength range 0.3 - 2.5 microns.
  • In fiber coupling calculations (CEF command), the evaluation of all possible modes in multimode fibers has been substantially improved in terms of accuracy and stability. This results in a more accurate computation of the CEF.
  • Macro parser: In rare circumstances the built-in mathematical functions (sin, cos, tan, abs, ...) were not correctly recognized. Now solved.
  • Minor changes.

Version 11.82
Changes in version 11.82:

  • OpTaliX now supports external glass catalogues, such as AGF files from Zemax. These catalogue files are converted to the internal glass catalogue format of OpTaliX (.csv) by a new command CONVAGF. Warning: Conversion of glass catalogues which already exist in OpTaliX may create ambiguities of the glass names. To avoid this, the corresponding glass catalogue in OpTaliX should be deactivated. This is accomplished in the menue item "Glass Manager" --> "Select Glass Catalogues". For further reading see the reference manual, §13.4
  • Macro/command line parser corrected: Mathematical functions (sin, tan, sqrt,...) were not correctly interpreted if at the end of a line. Now fixed.
  • Updated glass catalogues: SCHOTT, OHARA, CDGM, HIKARI/NIKON, NHG, SUMITA, HOYA, RADHARD (radiation resistant)
  • Warning messages on obsolete glasses now work reliably, provided the option "Warn if glasses are obsolete" in the preferences section (EDI PREF) is checked.
  • OpTaliX-LT: The new release (11.80) now allows browsing the examples library via a browser/viewer dialogue, which was formerly only available in the PRO/EDU editions. This option can now be accessed from the main menue FILE --> EXAMPLES_LIBRARY or by the command EXAMP.
  • Wavefront in afocal modus (AFO) could have been inaccurate in very rare circumstances. The inaccurcy was very small (in the order order of fractions of nanometers), which explains why it was not detected so far, except in very exotic systems.
  • Minor changes.

Version 11.70
Changes in version 11.70:

  • The full field grid PSF and diagonal PSF options (commands PSF FF and PSF DF) now work again as expected. Previously they repeated the PSF of one field instead of showing the variation of the PSF over field. Now corrected.
  • Ray aiming could fail when decentered or tilted surfaces in front of the stop surface could distort the entrance pupil. Taking account of pupil distortion can now be enabled or disabled by the new command: EPX yes|no.
  • In the transmission vs. surface plot, the zoom position is now selectable. Previously only the first zoom position could be plotted.
  • Raytrace at very steep EVEN aspheres could fail in very rare cases. The iteration algorithm has been improved.
  • Infrared transmitting glasses IG2 - IG6 from Vitron updated, IG9 added.
  • Transmission data of infrared transmitting glasses IRG22 - IRG27, AMTIR1, AMTIR2 and AMTIR6 added.

  • Minor changes.

Version 11.60
Changes in version 11.60:

  • The syntax for defining surface pickups and deleting has been refined and is now consistent.
  • The environmental editor (invoked by EDI ENV command) is now correctly updated in case surfaces are inserted or deleted.
  • New defintions of Zernike polynomials, the extended Fringe Zernike and the standard Zernike (after Born/Wolf) added. The type of the Zernike sets can be selected by the new command ZTYP or in Code V lingo SPS ZFR|ZFE|ZRN.
  • The Code V import/export filter now support the various Zernike sets (ZFR|ZFE|ZRN) and its coefficients.
  • A Zernike deformation defined on an aspheric base surface applied the deformation with the wrong sign. To the contrary, the Zernike definition on a spherical base surface was correct.
  • The aspheric surface deformation now also allows export of the data in FRED mesh format. See the menu Manufacturng --> Aspheric Deformation --> as 2D ...
  • Transmission analysis vs. wavelength (TRA LAM) now also exports the internal (bulk material) transmission to ASCII and Excel files.
  • Minor changes.

Version 11.50
Changes in version 11.50:

  • Determination of higher modes in calculating the fiber coupling efficiency (CEF) corrected. The problem occurred only in multi mode fibers. Calculation using mono mode fibers were not affected.
  • The fiber types OM1, OM2, OM3, OM4, OM5 according to the ISO 11801 standard have been added to the fiber catalogue.
  • Export to Code V: Sign of pickups if surface parameters are inverted now correctly written.
  • The field aberration plot (FIE command) failed if positive and negative field values were simultaneously specified.
  • Sumita and CDGM glass catalogues updated.
  • The SAG command applied to Fresnel surfaces returned incorrect values: Instead of the actual step-like form the sag of the base surface was returned. Now corrected.
  • The calculation of glass internal transmission could fail under very rare conditions. Now corrected.
  • Thin film calculations in non-sequential surface ranges improved. Previously the substrate index was not always correctly applied.
  • Minor changes.

Version 11.40
Changes in version 11.40:

  • The encircled/ensquared energy commands (ECE/EQE) were not updated when the system changes.
  • The encircled/ensquared energy data now can be exported to ASCII and Excel files.
  • Plot of user defined graphics (UGR) failed when Y plot limits were omitted. Due to a parser error the plot range was not automatically calculated. Now fixed.
  • Infrared material GASIR5 (Umicore) added to the special catalogue.
  • Updated GRIN glasses from Nippon Sheet Glass (NSG), added SLC18 gradient profile coefficients.
  • Two new commands: NWL returns the number of wavelength and NFI returns the number of fields.
  • Minor changes.

Version 11.30
Changes in version 11.30:

  • Polarization raytrace in non-sequential environments improved. Previously the polarization component (amplitude, phase) could be falsely overwritten by intermediate ray trace data.
  • The illumination analysis now supports ray sources in the format IES TM-25, in addition to the existing ASAP and ASCII ray formats.
  • The accuracy of the slope vector calculation at the SPS QCON surface type has been improved. Previously, slight aberration inconsistencies due to numerical rounding occured.
  • A potential program crash is now avoided in the CEF calculation: The program now ensures that the FFT grid size is greater or equal to the ray grid size (NRD).
  • The pupil map (PMA) option has been significantly accelerated, in particular at large grid sizes (NRD) and when the windows content needs to be refreshed.
  • Minor changes.

Version 11.20
Changes in version 11.20:

  • The parameter xsc,ysc,zsc and xsg,ysg,zsg did not account for zoom position in macros and lens database items (LDI). Always the first position was used. Now corrected.
  • Stability of MTF vs. defocus has been improved. An ill-conditioned multi-processor instruction caused subtle variations of the results between different runs.
  • SCO command corrected to accept entry of multiple coefficients, e.g. SCO ci..j correctly assigns the coefficients according to the surface type.
  • Polarization and transmission calculation in non-sequential environment reactivated.
  • Import/export from/to Zemax now supports the BINARY_2 surface type.
  • Inverse raytrace corrected at surfaces which are both aspheric and tilted.
  • Intensity calculation of rays improved in inverse raytrace. Previously the reflection coefficient at the second surface reflection in ghost analysis was incorrect.
  • Melt/private glasses: This option now allows up to 2000 wavelength/index data pairs to generate the glass dispersion coefficients. Previously, only 100 data pairs were allowed.
  • Handling problems of the coefficients of user defined surfaces (UDS) in the surface editor resolved.
  • Minor changes.

Version 11.00
Changes in version 11.00:

  • The interpolation of two-dimensional surface deformations (imported via INT files) has been significantly improved, in particular when the deformation contained very steep slopes.
  • A scaling problem in the "RAW2INT" command fixed. It was created by an inappropriate conversion of raw values to integer numbers in the INT file.
  • The program did not make use of multiple processors (if existent) but run in single processor mode instead. This effect was erroneously introduced. Now fixed.
  • The ray grid size (NRD = number of rays across diameter) can now increased to 2048 x 2048 rays to allow modelling of very fine structures in the entrance pupil.
  • The lens databease item [ABBE] now correctly accounts for dispersion offsets (DVO), if existent. Previously only the fixed abbe number of the catalogue glass was reported.
  • OHARA i-line glasses added to glass catalogue.
  • Minor changes.

Version 10.90
Changes in version 10.90:

  • Weight calculation did not account for mirror surfaces when ENVironment conditions (temperature and pressure) were activated. Now corrected.
  • ENVironment calculations did not correctly account for manually entered dn/dt data when automatic thermal coefficients from catalogue glass are unavailable.
  • The number of variables and functions in the LM optimization is now unlimited. Previously there was a limit of 100 variables and 20000 functions.
  • NHG glass catalogue updated: Internal transmission added, dispersion coefficients of IRG materials added.
  • Minor corrections on sagittal MTF when the fields are defined in the X/Z plane only.
  • Minor changes.

Version 10.80
Changes to version 10.80:

  • "Undo" and "redo" options added. A virtually unlimited number of parameter changes can be undone and redone.
  • Ray aimung, i.e. the generation of rays, is now significantly faster, is more stable and produces less spurious output.
  • A bug in the distortion calculation was corrected, when the field was defined by paraxial or real image height (YIM or YRI).
  • Minor tweaks.

Version 10.70
Changes to version 10.70:

  • The number of allowable sources for illumination analysis can now be changed by the MAXSRC command. Theoretically there is no upper limit (only limited by physical memory). Note: Without explicit specification of MAXSRC, the default number of allowable sources is 200.
  • The number of plot rays in illumination analysis changed randomly. Now corrected.
  • The wavelength used for illumination sources can now defined on the command line or in macros. Previously, only dialog based entry was possible.
  • Updated glass catalogue: CDGM
  • New glass catalogues: EP plastics from Mitsubishi Gas Chemical, and OKP plastics from Osaka Gas Chemical.
  • Updated glasses in special catalogue: IRG22, IRG24, IRG25, IRG26, IRG27, Zeonex350R, ZeonexF52R
  • Import of Synopsis optical design files (*.rle)
  • An inproper dispersion model of CDGM infrared materials was used. The index calculation is now correctly based on the Herzberger equation.
  • When the field definition is changed in the configuration dialog, the numerical field values are now automatically converted according to the new field definition.
  • When attaching an optical coating to a lens surface in the surface editor, the refractive indices of the coating substrate and the lens are now automatically checked if they are equal within a predefined index tolerance.
  • The commands ADX, ADY (aperture decenters) and ARO (aperture rotation) are now recognized again. They were inadvertently deactivated.
  • Minor tweaks.

Version 10.60
Changes to version 10.60:

  • Distortion function DISY corrected when the field definition was set to YRI (real image height).

  • The following analyses now also support field definitions in the X-direction:

    • MTF vs. field,
    • field aberrations,
    • distortion,
    • astigmatism,
    • relative irradiation.

    Previously, the fields were required to be defined along the Y-direction to create meaningful plots.

  • Vignetting (relative irradiance, RIRR) now correctly takes transmission effects (POL Y) into account. Previously the normalization to the reference field was omitted for this condition.

  • Illumination analysis: The number of rays used for plotting is now stable. Previously, plot rays could be "lost" under special conditions.

  • OpTaliX version 10.60 will be the last version to support 32-bit and 64-bit operating systems simultaneously. All future editions of OpTaliX will support 64-bit systems only.

  • Minor tweaks.

Version 10.50
Changes to version 10.50:

  • Index of refraction plot for selected glasses added.
  • Code V import and export: Support of pickup surfaces and central aperture obscurations.
  • Macro editor: The lens data items [ss], [so] and [si] were not recognized and returned error messages.
  • The tolerance sensitivities TSX, TSY, TSZ, TSA, TSB, TSG returned incorrect results due to an internal parameter shift. Now corrected.
  • TMAT command fixed where the transformation matrix is referred to global coordinates.
  • Wavefront plot vs. wavelength corrected. Previously the wavefront at only four wavelength were drawn even if more wavelength are defined.
  • SUMITA glass catalogue updated.
  • Minor tweaks.

Version 10.40
Changes to version 10.40:

  • The zoom command 'ZOO ...' was erroneously, temporarily deactivated and did not update the zoom editor. Now corrected.
  • Global surface coordinates (GSC command) corrected for systems that utilize combined tilts (alpha + beta + gamma).
  • The colour of graphics windows can now be inverted (dark background, white text). Adjustable in the Preferences section, colour tab.
  • Distortion plot corrected when the field definition was set to YRI (real image height) or YIM (paraxial image height).
  • Minor tweaks.

Version 10.25
Changes to version 10.25:

  • The reference manual is now opened in the application which is associated with this type of document (PDF). This way, the manual is opened in any PDF-viewer as defined by the file association of this extension (PDF). Previously, the Acrobat Reader was mandatory.
  • The UDS/SPS editor was erroneously invoked when editing asphere coefficients of an anamorphotic surface. These coefficients can be edited in the surface editor and need not the extra dialog. This behaviour was merely annoying and did not affect data integrity.
  • The following glass catalogues were updated: CDGM, NHG, HIKARI, NIKON, APEL
  • Astgmatic focal shift (ASF): Generation of object rays improved.
  • Ray generation on very wide angle systems (e.g. fisheye systems) improved in terms of accuracy and speed.
  • Zemax import/export: Improved support of coordinate break surfaces, Q-type surfaces, square and elliptical apertures and aperture offsets.
  • Minor tweaks.

Version 10.1
Changes to version 10.1:

  • New commands available: PSDX and PSDY calculate the PSF-diameter in X- or Y-direction at a defined intensity level. PSE calculates the ellipticity from the PSDX/PSDY ratio.
  • Creation of private (melt) glasses caused the program to crash under Win-10 operating systems only, older Windows versions (XP, Vista, 7) are not affected.
  • The following window handling problems specific to the LT-version have been eliminated:
    - Field aberration and astigmatism plots are now updated on window resize.
    - The menue items "Seidel aberration plot" and "Seidel aberration numerical output" activated.
  • Export to Code V: Aperture offsets ADX, ADY, ARO and Q-Type surfaces (QBF, QCON) are now converted.
  • Beam Propagation: Numerical stability of field amplitude calculation significantly improved.
  • DLF tolerance on aspheric surfaces calcuated incorrect functions. Now corrected.
  • Minor tweaks.

Versions 8.xx to 9.xx Summarizes history of obsolete versions 8.xx to 9.xx
Versions 7.xx Summarizes history of obsolete versions 7.xx
Versions 6.xx Summarizes history of obsolete versions 6.xx
Versions 5.xx Summarizes history of obsolete versions 5.xx
Versions 4.xx Summarizes history of obsolete versions 4.xx