- 64-bit version of OpTaliX-PRO/EDU released. This version requires a
new hardware key (dongle).
- Glass pickups in NSS environments are now better supported. It is
now possible to reverse the GL1/GL2 assignment by negative pickup numbers.
For example, a GL1/GL2 = AIR/BK7 interface is now modelled by the
reversed material sequence (BK7/AIR) on any subsequent non-sequential
surface with negative material pickup.
- The slider bars of the 3D perspective layout have been modified. Model
rotation is now defined by elevation and azimuth angles, which gives a more
intuitive handling of model rotation.
- On special user request, MTF plots now also output average MTF, i.e. (sag + tan)/2.
The plot type is selectable in the configuration dialog, "general" tab.
- Power calculation of illumination sources using the SCOS/SCOSX/SCOSY
parameters was incorrect.
- Transmission calculation in non-sequential surface ranges was incorrect.
- Code V import: The DIM command is now correctly interpreted. Previously,
field coordinates were not appropriately scaled and ray trace could fail
on the imported system.
- Hole apertures in sequential mode could lead to incorrect ray generation,
in particular when chief ray tracing is required (e.g. with XRI/YRI fields).
- Execution of macros was blocked if an error ocurred in macros which
involved file operations (read/write). In such cases, files were left
opened which prevented subsequent file access (open/close/read/write).
- Minor tweaks.
- Updated test plate lists from Elcan, Qioptic, Ross, Spectros.
- New lens catalogs from Anteryon, RPO, and Limo.
- Updated Schott glasses (with improved transmission): N-LASF31A, N-LAF21,
N-LAF33, N-LAF34, N-SF4, N-LAK7, N-BK7HT, N-SF6HTultra, N-SF57HTultra,
- Length of glass names and coating names has been extended to 64 characters.
- The CLC command (color code) has been superseded by the CCI command
which calculates the color contribution index (CCI) according to
ISO 6728. Although the old CLC command is still functional, it is now
- Wavefront export to INT file has been expanded: Scaling factor and
wavelength are now added to the exported data, so that the data
can be easier re-imported.
Bug Fixes only:
- Ray trace with anamorphic surfaces (AAS-type) in non-sequential environments
corrected. Previously, the opposite ray intersection points
were selected which lead to raytrace failures in NSS-environments
using this type of surface.
- Ray trace of array surfaces in non-sequential environments corrected.
- Exported BMP-images from the "extended object" analysis were inverted
about the horizontal axis. This was due to pixels written in the
- In lens draw, rendering of zoomed system improved. Previously, with the
option "show ALL zoom positions" in the lens layout plot, parts of the
system could be truncated, in particular with decentered surfaces.
- Support for latest visual styles on Windows XP/Vista/7.
- The number of test radii allowed per manufacturer has been increased
- Updated test plate lists from the following vendors:
CVI Melles Griot, Mikrop, Opco Laboratory, Qioptiq.
- Program crashed if DEZ command (dezoom) was applied on a system
that was already in single position mode.
- Incorrect definition of object rays corrected when fields were defined by
paraxial image height and immersed image space.
- The program crashed in the attempt to export data in Excel format
to a file that was already in use by another program. Now, this
condition is checked and a warning message is issued.
- Incorrect calculation of Zernike surfaces using coefficcient Z6
(astigmatism at 45°) now corrected.
- New glasses added:
- In the Schott catalogue : P-LASF51, P-LASF50, P-SK58A, P-SK60, P-LAK35, P-SF68
- In the Ohara catalogue : L-TIH53, L-LAH84, L-LAH85, L-LAH86,
L-LAH87, L-BBH1, S-FPM2, S-LAH55V, S-LAH65V
- In the Special catalogue : LITHOSIL-Q
- Non-sequential surface ranges may now include the object plane. This allows
full non-sequential modeling of optical systems and eliminates some
previous restrictions (e.g. NSS-ranges as part of a sequential system
and emittance of source rays on positive Z-direction only).
- Options for transmission analysis have been extended. Transmission plot
vs. wavelength now allows selection of polarization planes. Previously,
only the average (mean) transmission was displayed.
- Aspheric surface deformation may now stored in XYZ-files which are compatible
with Zygo interferometers. The file type is recognized by the "XYZ"
- Improved import of coating design files in MacLeod format (*.dds).
If unknown layer materials are detected during import, alternative
materials may be specified in a dialog box.
- Export to Zemax now supports global surface references. Due to the
differences in program structure/philosophy, each OpTaliX globally
referenced surface is expanded to three "coordinate break" surfaces
- The page setup dialog does include the "printer..." button again
on Windows Vista and Windows 7.
- Minor bugs corrected in the insert/delete surface option.
- Multilayer coating designs can now be inverted. This flips the complete multilayer
stack, including incident medium and substrate.
- Multilayer coatings assigned to surfaces are now loaded from the
current directory first, and (if not found) searched in the
coating directory as specified in the program preferences.
- A new command MAXAOI calculates the
maximum angle of incidence of rays that may occur on surfaces for a given range of fields and
- Glass catalogs can be specifically selected, allowing the use of one or multiple
glass catalogs in an optical system.
- Zemax import: "automatic" surface apertures are now correctly converted.
- In MTFA, MTFM, MTFS operands, results are now correctly returned for single wavelengths
other than the first wavelength. Previously, always the first specified wavelength was used.
- Improved stability of reading source ray files. Previously, extra
lines without data in generated ray source file could spoil the
- Handling of peak-to-valley data used in optimization (such as SPDPV, SPXPV, commands, etc.)
- On import of surface deformation files (e.g. from interferometric
measurements), aperture data were sometimes lost, depending on the system configuration. In some cases this
lead to a non-traceable optical system. Now corrected.
- ISO element drawings: Double specification of manufacturer names
corrected. For example, the glass definition "HIK:H-K5" was
erroneously plotted as "HIKARI: HIK:H-K5" in the ISO drawing.
- Handling of peak-to-valley data used in optimization (such as SPDPV,
SPXPV, etc.) now corrected.
- The zoom editor now accepts blank strings for glass names. Blank glass
names usually default to AIR. Previously it was necessary to specify "AIR" explicitly
if used in a zoom configuration.
- A new concatenation operator "//" (double slash) now allows
joining of strings in macros.
- Ohara glass catalog corrected. For some glasses, index of
refraction was incorrect.
- Minor tweaks.
- New glass Schott F2HT added.
- Extended options added about ray plotting in lens layout plots.
Check the lens draw option dialog (right-click in lens layout window).
- Results from two-path interferogram analysis can now saved as
Excel, ASCII or INT files.
- Import/Export of lens modules to/from Code V improved. Previously,
axial distances following a lens module were not correctly converted.
- A ray trace bug on XY-polynomial surfaces that has been erroneously
introduced in versions 7.24/7.25 is now corrected. In the previous
versions, the XY-polynomial Z-coordinate was not correctly handled.
- Minor tweaks
- Archer lens catalog updated.
- Rendering of illumination sources defined by bitmap images now
corrected. Previously, only square images (with:height = 1:1)
were correctly handled.
- In illumination analysis, generation of rays from flat objects
improved. Previously, some generated source rays were erroneously
ignored with the result that the emitted radiance was less than
- OpTaliX has been successfully tested with Windows 7.
- Array surfaces now also support hexagonal arrangement of array
cells. The new command ARH discriminates between rectangular
and hexagonal grids.
- The illumination option has been extended with ray aiming to the system entrance pupil.
In some extreme configurations, such as very wide-angle systems, this may accelerate illumination analysis because significantly
fewer rays are needed.
- Commands LADX, LADY added which calculate
the spectral dispersion for a given wavelength interval in the image. Preferably used
in spectrometer systems.
- Coatings attached to surfaces are now correctly inverted as well.
Previously, coating definitions were not inverted.
- Spot diagrams and wavefront analysis did not work with omnidirectional
- Coefficients of anamorphic asphere are now correctly handled in optimization.
- PV wavefront aberration corrected in wavefront plots.
- In illumination analysis, incorrect power calculation with extended Gaussian source fixed.
- In illumination analysis, inconsistencies in the definition of the
emitted light cone eliminated. This affected the "SRC DIVX" and
"SRC DIVY" commands. Previously, an "emitted pyramid" was occasionally assumed instead of
a true circular/elliptical light cone.
- Wavefront is now plotted at activated fields only, in order to be consistent
with other plots (spots, ray aberrations, etc). Previously, wavefront
was plotted for all fields, irrespectively of the active fields settings.
- Ray generation improved in conjunction with IMG command (variable image
surface). Previously, ray generation and vignetting control ignored the
IMG settings which could lead to unexpected beam truncation caused by
surfaces that were not effective (i.e. greater than the actual IMG surface
number) for a particular confinguration.
- The effect of solves was erroneously inverted if defined behind a mirror surface.
- Converting lens modules to standard surfaces using the surface type qualifier,
for example changing surface type "L" to "S", did not completely update
all relevant parameters. This could lead to unexpected results during
- Defining materials within a Lens Module environment caused ray trace errors.
Even though lens modules are mathematical constructs and materials in this
model have no physical meaning, consistent results are now obtained
irrespective of any material definition within the start and end surfaces
of lens modules.
- Array surfaces now also support hexagonal arrangement of array
cells. The new command ARH discriminates between rectangular
and hexagonal grids.
- The READ statement is now supported in macros. This statement reads
data from a file and assigns it to variables.
- The OPEN and CLOSE statements in macros have been extended to support
variables for unit and file name.
- A dual-path interferometer option has been added.
Two paths of a typical interferometer setup (e.g. Michelson, Mach-Zehnder, or Sagnac interferometer)
are traced and the two wavefronts are then superimposed to construct the
resulting interferogram. Design examples are provided in the examples library,
- Updated lens catalog from Rochester Precision Optics (RPO).
- CDGM glass catalog updated.
- Distortion analysis (DISX, DISY commands) was incorrect in
zoom systems due to an initialization problem.
- In biocular analysis (BIO command), the program crashed if the
contour plot option was selected.
- The correct function of the AFO (afocal) command was dependent on the sequence
of the AFO command in conjunction with other commands, in particular in zoom configurations.
- In non-sequential environments, coordinate transfer surfaces
with surface type "X" are now correctly handled. Previously, a
NSS ray trace could fail in presence of the "X" surface type.
- In non-sequential (NSS) environments, the optical path (phase) is now
- The TRA and RIRR commands produced inconsistent results.
- China-Daheng lens catalog added.
- The accuracy of the solid angle calculation (see RIRR command)
has been significantly improved.
- New database item: NRAYS returns the number of rays traced at
a specific field, wavelength and/or zoom position.
- A variety of test/source images have been added. These files are
stored in the "\optalix\images\" directory and include colour and grey bars,
Siemens star, TV test charts, USAF targets, grids and RGB colour images.
- Temperature coefficients on index of refraction (DnDT) updated and completed for
OHARA glass catalogue.
- Some glitches in the user interface of the "extended object analysis"
(EIMD command) removed. In addition, the resulting image may now stored
as bitmap file (BMP, PCX or PNG format).
- The context sensitive help in the tolerance dialog now works again.
- The size of the tolerance dialog is now correctly maintained between
sessions. Previously the dialog was always displayed at its minimum size
irrespective of user settings.
- The KT-optimization did not accept variable coefficients in user defined
- Coatings with file names greater than 10 characters could not be attached
to optical surfaces.
- In optimization/refinement of coatings, S- and P-planes were interchanged.
This lead to unexpected results in polarization critical applications.
- Import of coating files from the MacLeod package: Layers specified by
physical thickness (instead of optical thickness, the default) are now
correctly imported and interpreted.
- Dispersion coefficients of glass B270 in the special glass catalogue updated.
- Optimization using glass variables now supports real (catalog)
glasses instead of searching for fictitious glasses.
- Updated test plate list from Optimax.
- The glass polygon for defining constraints on glasses is now
integrated into the optimization parameter dialog as a separate
tab. This option is invoked by the "EDI OPR" command.
The previous command "EDI GLP" command is obsolete, but still
- Coating performance (reflection, transmission, phase) may now
exported to Excel.
- Memory requirements in illumination analysis have been substantially reduced.
Extensive illumination calculations are now possible even on computers
with very low physical memory.
- Zernike surfaces
may now be defined as SURFACE or PHASE deformation.
Previously, only surface deformation was supported.
- Design files from the "Handbook of Optical Systems" corrected.
Older versions of OpTaliX could not read some example designs.
- Field aberrations (FIE command) were not correctly plotted if the
system contained surfaces with (central) obscurations.
- The optical design files presented in the the book
"Handbook of Optical Systems", edited by H.Gross, are now included in the OpTaliX example design library and
may also separately downloaded from Optenso's download page.
More than 300 new sample designs are included in this special library.
- Improved handling of coating materials during import from the
MacLeod package. In case unknown material names are detected in
the import file, the program now opens a dialog box to assign
existing materials from the library to the unknown material names.
- Emittance properties of extended
illumination sources can now be
controlled. Previously only sources that emitted uniformly in angular
space were supported. The new parameter SCOS
now allows a broad variety of angular emittance characteristics, including Lambertian
- The program crashed if the example dialog was exited without
selecting a design example.
- Exporting PSF data to ASCII or Excel files could fail in case
of gray level, false colour, or contour rendering. The PSF
export now works under all rendering conditions.
- The limit on number of test plates has been eliminated.
Previously only 5000 test plates per vendor were allowed.
- Results from CAM calculations could not be exported to Excel/ASCII
files if the file/path specification contained blank characters.
Also, some spurious effects with the Windows ODBC interface were circumvented.
- In the lens catalog dialog (IMP CAT) the lens layout is now displayed.
This gives a better visualization of the optical system
or lens prior to loading (importing) it into OpTaliX.
- The ray source viewer now also allows
export of ray data in binary format.
This option completes the ability of the ray viewer
to fully convert ray source files, between ASCII and binary,
reduce file sizes by reducing number of source rays, and assign
a new (emittance) power to the whole source.
- New commands return the PV-values of spots and wavefront:
SPDPV, SPXPV, SPYPV, and WAVPV
- Parameters of illumination sources could be destroyed in zoom/multi-configuration systems.
- In aspheric deviation plots, spline deformation was not correctly
displayed if the base surface was aspheric.
- Defining very large ray source files could slow down rendering of
the lens layout plot significantly. This problem is now resolved by buffering
- OPD fan plots now work for all specified wavelengths again. In previous
versions the OPD was only plotted at the reference wavelength.
- A new dialog allows browsing through example designs.
- Zemax Import: Improved handling of fictitious (model) glasses
- Significant improvements to the illumination engine:
- Rays emitted from an extended source (e.g. lamp) are now
displayed in the lens layout plot. This allows a better control of the
illumination condition and the associated illumination ray paths.
- A power can be assigned to each source.
- Individual sources can be arbitrarily placed in 3D space
and arbitrary orientation with respect to the object surface
or the global coordinate system.
- Sources emittance is now defined by emittance angle and spatial extension and
no longer depends on the physical stop position (respectively entrance pupil).
- New macro options:
- The OPEN and CLOSE statements give access to external files
for subsequent read/write operations.
- A SELECT statement selects different external files (that have been
previously OPENed) to perform different operations on different files.
- Lens catalogs updated/added from ArcherOpTx, Asphericon, Geltech, 3M Precision Optics.
- Test plate lists updated, plus many more new test plates added from
Changchun BoXin, Changchun Hengrun, Chengdu SWOC, CVI Melles Griot,
Davidson Optronics, Edmund Optics, ELCAN Canada, IC Optical Systems,
JDSU, JML Optical Industries, LaCroix Optical, Maui Optical Systems and Imaging Center,
MediVision, Midwest Optical Systems, Primex, Rainbow Research Optics,
Republic Lens Company, Rochester Precision Optics, Ross Optical Industries,
SILO, SVG Precision Optronics-Tinsley, VLOC.
- New glass catalog from Rochester Precision Optics.
- In lens layout plots, cell offsets in array surfaces were not
- Lens modules focal length (MFL) was incorrectly scaled in the
SCA (scale) command.
- The varables MFL, MRD are now persistent. In previous versions
these variables were erroneously deleted if the variables/targets
editor (EDI VAR) was invoked.
Summarizes history of obsolete versions 6.xx
Summarizes history of obsolete versions 5.xx
Summarizes history of obsolete versions 4.xx