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OpTaliX Version History

Obsolete Versions 7.xx


Version 7.64
(22-May-2011)
New Features:

  • 64-bit version of OpTaliX-PRO/EDU released. This version requires a new hardware key (dongle).
  • Glass pickups in NSS environments are now better supported. It is now possible to reverse the GL1/GL2 assignment by negative pickup numbers. For example, a GL1/GL2 = AIR/BK7 interface is now modelled by the reversed material sequence (BK7/AIR) on any subsequent non-sequential surface with negative material pickup.
  • The slider bars of the 3D perspective layout have been modified. Model rotation is now defined by elevation and azimuth angles, which gives a more intuitive handling of model rotation.
  • On special user request, MTF plots now also output average MTF, i.e. (sag + tan)/2. The plot type is selectable in the configuration dialog, "general" tab.


Bug Fixes:

  • Power calculation of illumination sources using the SCOS/SCOSX/SCOSY parameters was incorrect.
  • Transmission calculation in non-sequential surface ranges was incorrect.
  • Code V import: The DIM command is now correctly interpreted. Previously, field coordinates were not appropriately scaled and ray trace could fail on the imported system.
  • Hole apertures in sequential mode could lead to incorrect ray generation, in particular when chief ray tracing is required (e.g. with XRI/YRI fields).
  • Execution of macros was blocked if an error ocurred in macros which involved file operations (read/write). In such cases, files were left opened which prevented subsequent file access (open/close/read/write).
  • Minor tweaks.


Version 7.58
(23-Jan-2011)
New Features:

  • Updated test plate lists from Elcan, Qioptic, Ross, Spectros.
  • New lens catalogs from Anteryon, RPO, and Limo.
  • Updated Schott glasses (with improved transmission): N-LASF31A, N-LAF21, N-LAF33, N-LAF34, N-SF4, N-LAK7, N-BK7HT, N-SF6HTultra, N-SF57HTultra, SF57HTultra.
  • Length of glass names and coating names has been extended to 64 characters.
  • The CLC command (color code) has been superseded by the CCI command which calculates the color contribution index (CCI) according to ISO 6728. Although the old CLC command is still functional, it is now considered obsolete.
  • Wavefront export to INT file has been expanded: Scaling factor and wavelength are now added to the exported data, so that the data can be easier re-imported.


Bug Fixes:

  • Minor tweaks.


Version 7.50
(01-Nov-2010)
Bug Fixes only:

  • Ray trace with anamorphic surfaces (AAS-type) in non-sequential environments corrected. Previously, the opposite ray intersection points were selected which lead to raytrace failures in NSS-environments using this type of surface.
  • Ray trace of array surfaces in non-sequential environments corrected.
  • Exported BMP-images from the "extended object" analysis were inverted about the horizontal axis. This was due to pixels written in the wrong order.
  • In lens draw, rendering of zoomed system improved. Previously, with the option "show ALL zoom positions" in the lens layout plot, parts of the system could be truncated, in particular with decentered surfaces.


Version 7.44
(12-Sept-2010)
New Features:

  • Support for latest visual styles on Windows XP/Vista/7.
  • The number of test radii allowed per manufacturer has been increased to 30000.
  • Updated test plate lists from the following vendors: CVI Melles Griot, Mikrop, Opco Laboratory, Qioptiq.


Bug Fixes:

  • Program crashed if DEZ command (dezoom) was applied on a system that was already in single position mode.
  • Incorrect definition of object rays corrected when fields were defined by paraxial image height and immersed image space.
  • The program crashed in the attempt to export data in Excel format to a file that was already in use by another program. Now, this condition is checked and a warning message is issued.
  • Incorrect calculation of Zernike surfaces using coefficcient Z6 (astigmatism at 45) now corrected.


Version 7.42
(18-July-2010)
New Features:

  • New glasses added:
    • In the Schott catalogue : P-LASF51, P-LASF50, P-SK58A, P-SK60, P-LAK35, P-SF68
    • In the Ohara catalogue : L-TIH53, L-LAH84, L-LAH85, L-LAH86, L-LAH87, L-BBH1, S-FPM2, S-LAH55V, S-LAH65V
    • In the Special catalogue : LITHOSIL-Q
  • Non-sequential surface ranges may now include the object plane. This allows full non-sequential modeling of optical systems and eliminates some previous restrictions (e.g. NSS-ranges as part of a sequential system and emittance of source rays on positive Z-direction only).
  • Options for transmission analysis have been extended. Transmission plot vs. wavelength now allows selection of polarization planes. Previously, only the average (mean) transmission was displayed.
  • Aspheric surface deformation may now stored in XYZ-files which are compatible with Zygo interferometers. The file type is recognized by the "XYZ" extension.
  • Improved import of coating design files in MacLeod format (*.dds). If unknown layer materials are detected during import, alternative materials may be specified in a dialog box.
  • Export to Zemax now supports global surface references. Due to the differences in program structure/philosophy, each OpTaliX globally referenced surface is expanded to three "coordinate break" surfaces in Zemax.
  • The page setup dialog does include the "printer..." button again on Windows Vista and Windows 7.


Bug Fixes:

  • Minor bugs corrected in the insert/delete surface option.




Version 7.36
(18-April-2010)
New Features:

  • Multilayer coating designs can now be inverted. This flips the complete multilayer stack, including incident medium and substrate.
  • Multilayer coatings assigned to surfaces are now loaded from the current directory first, and (if not found) searched in the coating directory as specified in the program preferences.
  • A new command MAXAOI calculates the maximum angle of incidence of rays that may occur on surfaces for a given range of fields and zoom position.
  • Glass catalogs can be specifically selected, allowing the use of one or multiple glass catalogs in an optical system.


Bug Fixes:

  • Zemax import: "automatic" surface apertures are now correctly converted.
  • In MTFA, MTFM, MTFS operands, results are now correctly returned for single wavelengths other than the first wavelength. Previously, always the first specified wavelength was used.
  • Improved stability of reading source ray files. Previously, extra lines without data in generated ray source file could spoil the data integrity.
  • Handling of peak-to-valley data used in optimization (such as SPDPV, SPXPV, commands, etc.) corrected.
  • On import of surface deformation files (e.g. from interferometric measurements), aperture data were sometimes lost, depending on the system configuration. In some cases this lead to a non-traceable optical system. Now corrected.
  • ISO element drawings: Double specification of manufacturer names corrected. For example, the glass definition "HIK:H-K5" was erroneously plotted as "HIKARI: HIK:H-K5" in the ISO drawing.
  • Handling of peak-to-valley data used in optimization (such as SPDPV, SPXPV, etc.) now corrected.
  • The zoom editor now accepts blank strings for glass names. Blank glass names usually default to AIR. Previously it was necessary to specify "AIR" explicitly if used in a zoom configuration.


Version 7.32
(20-Feb-2010)
New Features:

  • A new concatenation operator "//" (double slash) now allows joining of strings in macros.


Bug Fixes:

  • Ohara glass catalog corrected. For some glasses, index of refraction was incorrect.
  • Minor tweaks.


Version 7.30
(01-Feb-2010)
New Features:

  • New glass Schott F2HT added.
  • Extended options added about ray plotting in lens layout plots. Check the lens draw option dialog (right-click in lens layout window).
  • Results from two-path interferogram analysis can now saved as Excel, ASCII or INT files.


Bug Fixes:

  • Import/Export of lens modules to/from Code V improved. Previously, axial distances following a lens module were not correctly converted.
  • A ray trace bug on XY-polynomial surfaces that has been erroneously introduced in versions 7.24/7.25 is now corrected. In the previous versions, the XY-polynomial Z-coordinate was not correctly handled.
  • Minor tweaks


Version 7.25
(18-Nov-2009)
New Features:

  • Archer lens catalog updated.


Bug Fixes:

  • Rendering of illumination sources defined by bitmap images now corrected. Previously, only square images (with:height = 1:1) were correctly handled.
  • In illumination analysis, generation of rays from flat objects improved. Previously, some generated source rays were erroneously ignored with the result that the emitted radiance was less than specified.


Version 7.24
(08-Nov-2009)
New Features:

  • OpTaliX has been successfully tested with Windows 7.
  • Array surfaces now also support hexagonal arrangement of array cells. The new command ARH discriminates between rectangular and hexagonal grids.
  • The illumination option has been extended with ray aiming to the system entrance pupil. In some extreme configurations, such as very wide-angle systems, this may accelerate illumination analysis because significantly fewer rays are needed.
  • Commands LADX, LADY added which calculate the spectral dispersion for a given wavelength interval in the image. Preferably used in spectrometer systems.


Bug Fixes:

  • Coatings attached to surfaces are now correctly inverted as well. Previously, coating definitions were not inverted.
  • Spot diagrams and wavefront analysis did not work with omnidirectional ray aiming.
  • Coefficients of anamorphic asphere are now correctly handled in optimization.
  • PV wavefront aberration corrected in wavefront plots.
  • In illumination analysis, incorrect power calculation with extended Gaussian source fixed.
  • In illumination analysis, inconsistencies in the definition of the emitted light cone eliminated. This affected the "SRC DIVX" and "SRC DIVY" commands. Previously, an "emitted pyramid" was occasionally assumed instead of a true circular/elliptical light cone.
  • Wavefront is now plotted at activated fields only, in order to be consistent with other plots (spots, ray aberrations, etc). Previously, wavefront was plotted for all fields, irrespectively of the active fields settings.
  • Ray generation improved in conjunction with IMG command (variable image surface). Previously, ray generation and vignetting control ignored the IMG settings which could lead to unexpected beam truncation caused by surfaces that were not effective (i.e. greater than the actual IMG surface number) for a particular confinguration.
  • The effect of solves was erroneously inverted if defined behind a mirror surface.
  • Converting lens modules to standard surfaces using the surface type qualifier, for example changing surface type "L" to "S", did not completely update all relevant parameters. This could lead to unexpected results during ray trace.
  • Defining materials within a Lens Module environment caused ray trace errors. Even though lens modules are mathematical constructs and materials in this model have no physical meaning, consistent results are now obtained irrespective of any material definition within the start and end surfaces of lens modules.


Versions 7.16/7.18
(19-July-2009)
New Features:

  • Array surfaces now also support hexagonal arrangement of array cells. The new command ARH discriminates between rectangular and hexagonal grids.
  • The READ statement is now supported in macros. This statement reads data from a file and assigns it to variables.
  • The OPEN and CLOSE statements in macros have been extended to support variables for unit and file name.
  • A dual-path interferometer option has been added. Two paths of a typical interferometer setup (e.g. Michelson, Mach-Zehnder, or Sagnac interferometer) are traced and the two wavefronts are then superimposed to construct the resulting interferogram. Design examples are provided in the examples library, interferometer section.
  • Updated lens catalog from Rochester Precision Optics (RPO).
  • CDGM glass catalog updated.


Bug Fixes:

  • Distortion analysis (DISX, DISY commands) was incorrect in zoom systems due to an initialization problem.
  • In biocular analysis (BIO command), the program crashed if the contour plot option was selected.
  • The correct function of the AFO (afocal) command was dependent on the sequence of the AFO command in conjunction with other commands, in particular in zoom configurations.
  • In non-sequential environments, coordinate transfer surfaces with surface type "X" are now correctly handled. Previously, a NSS ray trace could fail in presence of the "X" surface type.
  • In non-sequential (NSS) environments, the optical path (phase) is now correctly calculated.
  • The TRA and RIRR commands produced inconsistent results.


Version 7.12
(29-March-2009)
New Features:

  • China-Daheng lens catalog added.
  • The accuracy of the solid angle calculation (see RIRR command) has been significantly improved.
  • New database item: NRAYS returns the number of rays traced at a specific field, wavelength and/or zoom position.
  • A variety of test/source images have been added. These files are stored in the "\optalix\images\" directory and include colour and grey bars, Siemens star, TV test charts, USAF targets, grids and RGB colour images.
  • Temperature coefficients on index of refraction (DnDT) updated and completed for OHARA glass catalogue.


Bug Fixes:

  • Some glitches in the user interface of the "extended object analysis" (EIMD command) removed. In addition, the resulting image may now stored as bitmap file (BMP, PCX or PNG format).
  • The context sensitive help in the tolerance dialog now works again.
  • The size of the tolerance dialog is now correctly maintained between sessions. Previously the dialog was always displayed at its minimum size irrespective of user settings.
  • The KT-optimization did not accept variable coefficients in user defined surfaces (UDS).
  • Coatings with file names greater than 10 characters could not be attached to optical surfaces.
  • In optimization/refinement of coatings, S- and P-planes were interchanged. This lead to unexpected results in polarization critical applications.
  • Import of coating files from the MacLeod package: Layers specified by physical thickness (instead of optical thickness, the default) are now correctly imported and interpreted.
  • Dispersion coefficients of glass B270 in the special glass catalogue updated.


Version 7.10
(15-Feb-2009)
New Features:

  • Optimization using glass variables now supports real (catalog) glasses instead of searching for fictitious glasses.
  • Updated test plate list from Optimax.
  • The glass polygon for defining constraints on glasses is now integrated into the optimization parameter dialog as a separate tab. This option is invoked by the "EDI OPR" command. The previous command "EDI GLP" command is obsolete, but still supported.
  • Coating performance (reflection, transmission, phase) may now exported to Excel.
  • Memory requirements in illumination analysis have been substantially reduced. Extensive illumination calculations are now possible even on computers with very low physical memory.
  • Zernike surfaces may now be defined as SURFACE or PHASE deformation. Previously, only surface deformation was supported.


Bug Fixes:

  • Design files from the "Handbook of Optical Systems" corrected. Older versions of OpTaliX could not read some example designs.
  • Field aberrations (FIE command) were not correctly plotted if the system contained surfaces with (central) obscurations.


Version 7.08
(21-Dec-2008)
New Features:

  • The optical design files presented in the the book "Handbook of Optical Systems", edited by H.Gross, are now included in the OpTaliX example design library and may also separately downloaded from Optenso's download page. More than 300 new sample designs are included in this special library.
  • Improved handling of coating materials during import from the MacLeod package. In case unknown material names are detected in the import file, the program now opens a dialog box to assign existing materials from the library to the unknown material names.
  • Emittance properties of extended illumination sources can now be controlled. Previously only sources that emitted uniformly in angular space were supported. The new parameter SCOS now allows a broad variety of angular emittance characteristics, including Lambertian sources.


Bug Fixes:

  • The program crashed if the example dialog was exited without selecting a design example.


  • Exporting PSF data to ASCII or Excel files could fail in case of gray level, false colour, or contour rendering. The PSF export now works under all rendering conditions.


  • The limit on number of test plates has been eliminated. Previously only 5000 test plates per vendor were allowed.


  • Results from CAM calculations could not be exported to Excel/ASCII files if the file/path specification contained blank characters. Also, some spurious effects with the Windows ODBC interface were circumvented.




Version 7.04
(02-Nov-2008)
New Features:

  • In the lens catalog dialog (IMP CAT) the lens layout is now displayed. This gives a better visualization of the optical system or lens prior to loading (importing) it into OpTaliX.
  • The ray source viewer now also allows export of ray data in binary format. This option completes the ability of the ray viewer to fully convert ray source files, between ASCII and binary, reduce file sizes by reducing number of source rays, and assign a new (emittance) power to the whole source.
  • New commands return the PV-values of spots and wavefront: SPDPV, SPXPV, SPYPV, and WAVPV


Bug Fixes:

  • Parameters of illumination sources could be destroyed in zoom/multi-configuration systems.
  • In aspheric deviation plots, spline deformation was not correctly displayed if the base surface was aspheric.
  • Defining very large ray source files could slow down rendering of the lens layout plot significantly. This problem is now resolved by buffering plot rays.
  • OPD fan plots now work for all specified wavelengths again. In previous versions the OPD was only plotted at the reference wavelength.


Version 7.02
(14-Sept-2008)
New Features:

  • A new dialog allows browsing through example designs.
  • Zemax Import: Improved handling of fictitious (model) glasses
  • Significant improvements to the illumination engine:

    • Rays emitted from an extended source (e.g. lamp) are now displayed in the lens layout plot. This allows a better control of the illumination condition and the associated illumination ray paths.
    • A power can be assigned to each source.
    • Individual sources can be arbitrarily placed in 3D space and arbitrary orientation with respect to the object surface or the global coordinate system.
    • Sources emittance is now defined by emittance angle and spatial extension and no longer depends on the physical stop position (respectively entrance pupil).
  • New macro options:

    • The OPEN and CLOSE statements give access to external files for subsequent read/write operations.
    • A SELECT statement selects different external files (that have been previously OPENed) to perform different operations on different files.
  • Lens catalogs updated/added from ArcherOpTx, Asphericon, Geltech, 3M Precision Optics.
  • Test plate lists updated, plus many more new test plates added from Changchun BoXin, Changchun Hengrun, Chengdu SWOC, CVI Melles Griot, Davidson Optronics, Edmund Optics, ELCAN Canada, IC Optical Systems, JDSU, JML Optical Industries, LaCroix Optical, Maui Optical Systems and Imaging Center, MediVision, Midwest Optical Systems, Primex, Rainbow Research Optics, Republic Lens Company, Rochester Precision Optics, Ross Optical Industries, SILO, SVG Precision Optronics-Tinsley, VLOC.
  • New glass catalog from Rochester Precision Optics.

Bug Fixes:

  • In lens layout plots, cell offsets in array surfaces were not correctly drawn.
  • Lens modules focal length (MFL) was incorrectly scaled in the SCA (scale) command.
  • The varables MFL, MRD are now persistent. In previous versions these variables were erroneously deleted if the variables/targets editor (EDI VAR) was invoked.

Versions 6.xx Summarizes history of obsolete versions 6.xx
Versions 5.xx Summarizes history of obsolete versions 5.xx
Versions 4.xx Summarizes history of obsolete versions 4.xx