- Importing lenses from vendor catalogs now offers options to filter
the lens catalogs on parameters like EFL and diameter.
- Biocular analysis for optical systems that are
viewed with two eyes simultaneously.
- New macro options:
- The INPUT statement
prompts the user for numeric data
or text data during execution of the macro.
- A WHILE-ENDWHILE loop control
allows execution of a loop until a specific condition is true.
- New lens database items (LDI):
- IND returns the refractive index of glasses.
- ABBE returns the dispersion value (Abbe number) of glasses.
- Zernike coefficients are now available as variables
- Accuracy of diffraction MTF calculation improved for small ray grids
(NRD 8 or NRD 16).
- Aspheric deviation analysis (ASD, ASD2) could not plot surface shape
of user defined surface (UDS).
- Illumination analysis produced inconsistent results. This occured only
in zoom/multi-configuration systems.
- An option to export PSF data to ASCII or EXCEL files
has been added to the PSF dialog.
- Calculation of the wavelength and order dependent
diffraction efficiency on diffractive surfaces (gratings, holograms)
is now supported.
- OSLO import now recognizes decentered surfaces, multiple
apertures and decentered/rotated apertures.
- Inconsistent patch values in PSF-3D and PSF-XY plots corrected.
- In macro "IF" conditions, the "equal" operand (==) was not correctly parsed.
- Coatings attached to surfaces: If a coating file contained material pickups,
refractive indices of layers were not correctly updated.
- Coating refinement/optimization: Layers including material dispersion
are now correctly handled.
- Tolerance sensitivity analysis did not account for tilt and decenter
tolerances if the surface was globally referenced.
- Inverting surfaces did not correctly handle some array parameters
(AMX, AMY, AADE, ABDE, ACDE) which resulted in an incorrect ray trace
after the inversion.
- Tolerance analysis: Changes made to a system due to tolerances were not
completely inversed (restored) after the tolerance run. This effect only
occured if compensators have been defined in an optimization setup, and
did not affect simple thickness or defocus compensators.
- Zooming wavelength (WL command) did not correctly update index of refraction
on surfaces with material links (i.e. when material properies were copied from
- Rays defined in ray source files are now correctly transformed to other
coordinates/angles. Previously, the Z-coordinate was not correctly interpreted.
- DMD command corrected.
- Windows that are minimized are now resized to "normal" size
when selected from the tree view window. Previously, windows
were activated but stayed minimized.
- In FIE analysis, plot of distortion could fail. Now corrected.
- The program ignored MFR/MFRF settings (spatial frequency for
MTF-plots vs. frequency respectively field).
- A FORMAT option has been added to the PRINT command. This allows
formatted output of numerical data and text and is particularly
useful in loop environments (DO-ENDDO) where tabulated data is
- The ECE (encircled energy) command has been modified and expanded.
In addition, a new command EQE has been added for ensquared energy.
- An import option for Optilayer thin-film coatings has been added.
This allows to read coating designs in the native Optilayer format
- The ray aiming procedure has been enhanced such that all wavelengths
used in a system are now taken into account. Previously, ray aiming was performed only
at the reference wavelength.
- Numerical data obtained from photorealistic ghost analysis can now
be saved to ASCII files and to Microsoft Excel directly.
- Export of data to Excel could fail in case of large arrays of data. This
interface now works reliably.
- Two-point holograms on mirror surfaces could lead to incorrect ray trace results.
This did not affect two-point holograms used in transmission or other hologram types.
- The Chinese glass catalogue (CDGM) now includes equivalent glasses.
- New Schott glasses added: P-SF8, N-SF2, N-KZFS5.
- Output of optical path difference (OPD, OPDW) is now given relative
to the chief ray which appears to be more practicable. Previously,
OPD/OPDW were given in absolute units.
- Tolerances that are defined but not used (i.e. not checked in the
tolerance editor) are now
saved with the optical design data. This
allows re-activation of tolerances at a later stage without the need
to enter tolerances again.
- Exporting graphics to the formats WMF, PNG, SVG, BMP, PCX is now also
supported from the command line and in macros. Previously this was only
possible from the graphical user interface (GUI). See the command
GRA for more information.
- Two new commands have been added to control the bitmap size of graphics exported
to the clipboard or to files: BMPX, BMPY.
- Conrady's D-d method for correcting chromatic spherical aberration is
now implemented. The DMD command
has been added to support this option.
- In environment analysis, aspheric coefficients are now correctly scaled
- Corrected distortion calculation if the object space is filled with a
material other than air.
- Restoring optical systems containing lens modules could cause
incorrect rendering of fields.
- Objects at infinity are now defined for object distances >1.E10 mm
(previously >1E20) to improve numerical stability.
- Default constraints in optimization, in particular MNA (axial thickness),
MNE (edge thickness), could lead to premature termination of optimization
if improper surface heights were set.
- Radial energy (RAD) now correctly takes
square or rectangular image patches into
account. Previously, only circular image areas were calculated, irrespectively of the
- Uninitialized parameters in macros are now assumed zero and the macro is
continued. Previously, the macro was aborted under such conditions. The behaviour
is now consistent with the manual description.
- Schott glasses added: LITHOSIL-Q, FK5HT, BK7HT, LLF1HT, LLF6HT, LF5HT
- New command IMG added. This command allows re-definition of the image
surface number. It is particularly useful in systems which require
two (or more) image planes. An example would be analyzing/optimizing
for optimum performance at an intermediate image AND at the final
- In macros, missing parameters are now assumed zero as described in the
reference manual. Previously, an error message was issued and the
macro was terminated.
- Plot of aspheric deformations improved. The ASD command has been enhanced
to allow specification of reference radius and radial sampling.
- New command IFR added which allows
definition of increment in (spatial)
frequency used in MTF calculations.
- Import of interferometric deformations could crash if interferograms
of different sizes were simulatenously used in a system.
- Incorrect error messages were issued on zooming wavelengths or glasses.
Even though this did not affect validity of calculations, it was
annoying due to excessive error messages.
- Variables used inside of a lens database item (LDI) were incorrectly
interpreted under special conditions and lead to premature termination
of a macro.
- Cylinder surfaces in non-sequential environments were incorrectly
traced under extreme conditions. Notice that this did not affect
cylinder surfaces in sequential ray trace.
- Incorrect report of NAO in FIR command.
- In illumination plots, cross sections in false colour plot were reversed.
- Minor improvements on the command line parser.
- Incorrect reporting of MTFA (average MTF) corrected. Note that this
ONLY concerned numeric output but not MTF calculation (version 6.79).
- Bitmap images of grid PSF can now written to BMP, PCX or PNG files.
In addition, field coordinates can be displayed on each
grid PSF. In case of systems with intermediate image(s), bitmap image
display can be inverted to allow correct rendering of PSF's.
- Interferograms attached to a surface now display the surface aperture
overlayed to the surface deformation.
This allows a more precise control of the measured interferogram dimensions
in relation to the aperture of a surface.
- An omni-directional ray aiming mode has been added. Rays can be launched at a full
+/- 180° angular range which covers the full 4p sphere.
- Inverse tolerance analysis could crash in absence of tolerance criteria.
- In systems using aspheric surfaces the PATH command returned incorrect results.
- Personal settings of the main tree view window are now memorized
between different program sessions. Previously, a predefined window
width was always set at program start.
- Improved window handling: Size and position of windows and dialogs
are now more correctly restored between sessions, respectively
on closing and re-opening a window or dialog.
- OpTaliX has been successfully tested on the newly released Windows VistaTM.
In particular, when upgrading to Vista make sure you are using the
latest Hardlock (dongle) driver.
- The user interface has been substantially reworked. Windows are now
easily accessible by a hierarchical tree view. The second command line
is now floating and can be placed anywhere on the screen.
- In the macro editor, a separate input field has been added for
passing parameters to the macro script. Previously, parameters could
only be passed via the command line.
- Exporting graphics to AutoCad DXF now writes "polylines". Previously
separated line segments were written which made editing of the drawing
in third-party programs cumbersome.
- Cylinder surfaces were not correctly recognized in BEA (Gaussian beam analysis).
- Both absolute and relative DNDT values are now listed
(see LIS DNDT command).
- Local surface coordinate axes can be plotted in lens layout plots.
- Grid distortion plot
has been amended with numerical distortion data.
In addition, grid distortion can now calculated on the basis of chief ray,
spot gravity center and PSF gravity center.
- Transmission analysis vs. surface has been enhanced: It is now possible to
analyze transmission averaged over the full pupil for each surface individually.
Previously, only chief-ray transmission was considered.
- In zoom systems, default constraints on THI (thickness) were ignored.
- Code V export: Private glass coefficients were exported in the wrong format.
- In extended image analysis (EIMD), width of a Gaussian source is now correctly
defined by 1/e2 INTENSITY. Previously, 1/e2 AMPLITDUE was assumed which
- Zemax import and export: Combined tilts on a single surface are now
correctly interpreted. Previously, tilt about Y-axis was converted with
- Ray aiming of wide angle systems (e.g. Fish-Eye systems) is now much more
stable. Previously, ray aiming could fail at very wide field angles. This
improvement is also accompanied by a small speed improvement.
- New parameters for tolerance sensitivity have been added
to optimize for 'as-built' performance. This is a new feature.
See commands TSA to TSZ.
- Optimization now terminates if a certain limit on ray errors is
exceeded. The stopping criterion can be
adjusted in the optimization parameters section or by the
new OERR command.
- Glass catalogues from SCHOTT, OHARA and HOYA have been reworked
and new glasses added.
- Melt frequency and relative price information have been added
to the SCHOTT, OHARA and HOYA catalogs. This information is listed
by the commands LIS GLA and LIS ALG.
- Export to Code V now also supports fictitious glasses.
- Import of Macleod coating files has been reworked to account for
newer versions of the Macleod coating design file format.
- Glasses with index- and dispersion-offsets (DNO, DVO) are now
indicated by red colour in the surface editor and by an additional
asterix in the surface listing.
- In CAM-calculations, the stepping increment now may also be negative.
Previously, CAM-calculation stopped prematurely with negative increments.
- Ray sets given in ASAP binary DIS-format can now be read as well.
This is an additional option in illumination analysis.
- OpTaliX can now be run with normal USER rights. Previously,
administrator rights were needed to run OpTaliX.
Note that for installation, including upgrades, administrator
priviledges are still required. This change takes account of
future requirements in Windows Vista.
- The ghost RGB-plot was inappropriately scaled.
- Command syntax of ghost parameters has been revised for
- Many subtle changes concerning improvement of the user interface.
- In ghost analysis, the image of the source which caused ghost
effects can now be rendered together with ghost images.
This gives a combined image (source + ghost) and allows
a better judgement of ghost intensity in relation to the
nominal image intensity.
- Ghost parameter can now saved with lens prescription.
- The definition of variable coating thicknesses in coatings attached
to optical surfaces now allows non-symmetrical thickness
variations. Previously, only radial variations could be modeled.
See CTV command.
- OSLO export: Now supports fictitious glasses. The exported fictitious
glass data are written to a file compatible with the OSLO private glass
- Macro language: A RETURN
statement has been added to pass variables
to calling functions.
- In transmission analysis, POL and TRA settings were sometimes
erroneously ignored. Now fixed.
- Wavefront analysis improved. In systems containing combinations of
Zernike deformations and tilt/decenter on the same surface, a spurious
tilt of the wavefront has been eliminated.
- PSF-data are now written in E-format as opposed to the fixed
format used previously. This allows a more accurate representation
of numeric PSF-data.
- Results from ghost analyses now allow logarithmic plots.
- Multiple sources are now allowed in
illumination analysis. Previously
only one source could be simulated.
- Illumination analysis now supports
sources defined by ray sets.
Also allows import of
ray files for modelling real light sources.
- Export to ASAP improved (biconic and anamorphic surface included).
- Hologram phase plots improved.
- In transmission analysis, POL and TRA settings were sometimes
- Ghost analyses failed in systems using aspheric surfaces of types
AAS, SPS ODD and SPS XYP. Other aspheric surface types were not
- Aspheric deviation plots (ASD command) now plots coefficients of
anamorphic (biconic) surfaces. This was previously omitted.
- The wavelength interval in transmission plots can now be
arbitrarily defined. A new command "TRA STEPS" is available
to define the number of sample points within the system
- Spot vs. zoom position plot could crash if the optical system
was not zoomed (i.e. fixed focal length).
- In MTF calculations, the optional parameter zk (zoom position)
was not recognized.
- A printer symbol has been added to the main toolbar to simplify
printing all, or selected text from the text window.
- Plots of RMS-spot vs. field now shows spot-diameter. Previously
spot-radius was used as default. This makes this plot consistent with other
commands (compare with SPD and SPR commands).
- PSF data can now be written to an ASCII file. See the PSF command
with the optional FIL parameter.
- A new command GPSF calculates geometric PSF. It is based
on geometric ray tracing (i.e. no diffraction) and is useful
in systems with large aberrations.
- Glass P-SF67 from Schott is new and has been added to glass catalogue.
- CDGM glass catalogue added. This catalogue replaces the generic
chinese glass catalogue.
- Get access to all ray data, respectively store it in a file.
A new command RAYLOG has been added, which allows logging of ray data
to a file. This command is quite general as ANY ray data at a
specific surface can be stored.
- Code V Import: Unrecognized commands are now reported in a log-file.
- Scaling system data with overall length requirement (SCA OAL)
- Improved window handling. Previously, putting a graphic window
to foreground could lead to improperly scaled plots.
- Parameters passed to macros were not correctly handled and the program
hung in an infinite loop. This bug was inadvertently re-introduced in
- Iteration for real field coordinates (XRI, YRI) could fail in zoom systems
due to uninitialized start parameter.
- Array parameter are now also accessible in the surface editor.
Previously, only command line input was accepted.
- The number of plot rays allowed in lens layout drawings is now
unlimited. Previously, a maximum of 500 rays could be plotted.
- The coating material editor has been enhanced. In addition to
user-defined (private) coating materials, predefined (catalogue)
coating materials are also shown. This gives a better overview
about the coating materials available.
- Inserting lens systems from lens catalogues corrected. Previously,
surfaces following the inserted system could have been corrupted.
|Version 6.46 / 6.48
- Improved automatic scaling of 2D-aspheric deviation plots.
- Improvements on importing cylinder surfaces from
Code V and Zemax files.
- Import from OSLO now takes account of changes made to special
apertures in the OSLO package.
- Surface editor: Pickups at XDE/YDE/ZDE and ADE/BDE/CDE were not correctly recognized.
- Importing files from other design packages now automatically adds the appropriate
file extension, if omitted (for example .seq, .zmx, .len, etc.)
- Transmission calculation using multilayer coatings corrected.
- Anamorphic asphere surface added.
With absence of higher-order coefficients
this surface type is also sometimes referred to as biconic surface.
- Cylinder surface added.
Even though cylinders can be modelled using the
EVEN asphere, a separate surface type "cylinder" has been added to
simplify data input.
- Enhancement to Import/Export filters:
- OSLO : Now supports both extensions, *.len and *.osl.
- OSLO : Now recognizes RETurn coordinates to a previous surface.
- Code V: Now supports surface labels (surface comments).
- 2D-aspheric deviation: Now also allows reference to best-fit sphere.
Plots have been amended with reference sphere radius, RMS- and PV-
- Edge thickness (ET) calculations now also work with decentered/tilted
surfaces and in non-sequential environments.
- Corrected dn/dT for plastic materials PMMA and POLYCARB.
- CUX variable not recognized in surface editor.
- Corrected bug in storing/restoring user-defined GRIN coefficients.
- Copying surfaces containing user-defined GRIN media now works correctly.
- Dn/dT coefficients for Zeonex plastic materials updated.
- Topas 5013 plastic material added.
- Minor improvements to the ghost lens layout plot (ghost view).
- Export to ASAP added.
- Logarithmic display added to illumination plots.
- The surface editor was not properly updated with CAM-mode enabled (i.e. CAM Y).
- In optimization, strictly symmetric problem cases could lead to
a false identification of ineffective variables and removal of
these variables from optimization.
- Minor corrections to the command line and macro parser.
- Violations of optimization constraints, (equal, less than,
or greater than) are now also indicated by a bar of asterisks
(***) to allow easier identification of problem cases. See
the outputs generated by the commands LIS OPT or ERRF.
- Variables in macros and command line input now may also contain
- Globally referenced surfaces (see GLB command) now may also be
of DAR tilt type. Previously, only NAX tilt type was allowed
at global references.
- Grid distortion analysis (see PLO GID) now also works for decentered
and tilted systems where paraxial references may be inappropriate.
Now the (distortion-free) reference grid is based on real rays
which works for any kind of configuration.
- Export to IGES added. The current
implementation supports arbitrary tilts/decentrations, rays, apertures
trimmed surfaces and edges.
- Lens edge apertures may now also edited in the surface ediror, aperture
tab. Previously, definition of lens edges was only possible from the
- Surface coordinates may also be defined/entered by a transformation matrix
using the new TMAT command. This complements the XDE/YDE/ZDE and
- Minor glitches in the command line and macro parser corrected.
- The index profile of coatings may now be plotted. See
COA PRO command.
- Alternative glasses with respect to a base glass may now be listed.
See LIS ALT command.
- Variable assignments in macros and command line input has been
extended to handle strings.
- Two-character commands (such as NA) were not properly handled
in zoom systems.
- Improved string handling in IF-ELSE-ENDIF constructs in macros.
Previously string comparisons could fail if strings were
specified in mixed upper/lower case.
- Defining pickups has been greatly reworked
and enhanced. It is now
possible to define group pickups and individual pickups with tilt/decenters
and aspheres. For example, a pickup may now be applied on XDE only without
affecting other tilt/decenter parameters at the same surface. The same holds for aspheric pickups.
- In conjunction with pickups, the commands CPI, DPI, API, TPI, MPI
are obsolete (though still functional for backwards compatibility)
and are superseded by the corresponding PIK XXX commands.
- New material added: Diamond
- Surfaces with the TIR flag (total internal reflection) in sequential mode
now check any index ratio n/n'. This is specified by the materials in
GL1 and GL2. Previously, TIR was calculated against AIR only.
- Pickups of SPS ODD and SPS XYP surfaces were not properly recognized.
- Coating names up to 256 characters (including path) are now supported.
- A new surface qualifier "g" has been added. It allows output of
ray coordinates in global coordinates referred to another surface
specified by the "g" parameter. For example "Y s2 f4 g3" outputs ray data
with reference to the coordinate system of surface 3.
- Code V import: Greater flexibility of importing zoomed parameters
in sequential files.
- Checks added to non-sequential parameters to support setup of
non-sequential surface ranges.
- Updated lens catalogs.
- Restoring systems from the menu option Optimization -> Undo
optimization cycle now works again. This bug was erroneously introduced
in version 6.22. Earlier versions were not affected.
- After closing the slider control dialog, it could not be displayed
- Under certain conditions rays could not be traced to SPS XYP surfaces.
- Columns in editor windows (such as surface editor, coating editor,
Zernike editor, etc) can now be resized by the user.
To resize a column, drag the divisions between column labels.
- Added toolbar icons in zoom editor for easier access to append
zoom parameters, change number of positions and get help.
- Slider controls added to allow interactive changes of construction
- IF constructs are now supported in macros.
- GL2 now accepts private glasses.
- Variables for SPS ODD and SPS XYP surfaces were not accepted in the
command line. This has been fixed.
- Minor improvements on ray aiming.
- Minor corrections on parsing arithmetic expressions in macros.
- Buttons to print and search the contents of the text window have been added.
- Corrected edge drawing in 3D layout window.
- Code V import now handles zoomed glasses correctly. The ZOO prefix, however, is still
required in sequential files (*.seq).
- In illumination analysis, minor corrections on ray distribution.
- Zoom positions are now taken into account in illumination analysis.
- In wavefront RMS analysis (see WAV command)
it is now possible to subtract wavefront tilt.
- Corrected TCE values for quartz, silica and sapphire in the special glass database.
- Glasses added to Schott catalogue: P-PK53, P-SK57, P-LASF47
- Fixed program crash when inserting several zoom positions
successively from the zoom editor window.
- Minor improvements on radial and 2D aspheric deformation plots.
- In ISO element drawings, surfaces were shown reversed if a lens
followed a mirror. Now fixed.
- Invoking the configuration dialog with several other windows opened
could hang the program. This effect was erroneously re-introduced
in version 6.14. Now fixed.
- New glasses added: Schott N-SF14, N-LASF46A
- Variables may now be combined with qualifiers for surface, field,
wavelength or zoom position. For example, "s2" (without the quotes)
may now also specified as s$x, assuming a previous
variable assignment $x = 2. The same applies to fields
(f$x will be interpreted as f2), wavelengths (w$x is interpreted as w2) and
zoom positions (z$x is interpreted as z2).
- Automatic oversizing of surface apertures is now possible by factor
or by a fixed value applied to each surface. Previously only "by factor" was possible. To be set in the
Preferences, operations tab.
- Aspheric deformation plots can now also shown as 2-dimensional height
field in either wire-grid, contour or false-colour mode. Previously
only radial scans over the surface were possible.
- The coating material editor now supports up to 600 data points per material. Previously, only
100 points were allowed.
- Entering non-digit values in the asphere pickup column of the
surface editor caused the program to crash.
- The program crashed at MTF FLD plots when the number of fields was >11. This was due
to an inappropriate allocation of work arrays. Now corrected.
- Setting vignetting factors now also reports surfaces which cause
vignetting (see SET VIG command).
- Test plates from Wolf-Optik, Germany, added.
- Surfaces selected in the surface editor (i.e. the row which has focus) are now highlighted in the
lens layout plot by blue colour.
- New glasses added:
Schott : N-FK51A, N-LASF31A, N-SF11
Ohara : L-LAH81, L-LAM72, S-BSM21, PBH55, PBH56, LAH80, S-TIH20 and
Clearceram-Z as CERAM-Z, CERAM-ZHS
- Cylindrical GRIN lenses from Grintech (Jena, Germany) added. In addition to the radial
profiles (short code: GRT), cylindrical profiles are accessed by the
short code GRC.
- MTF vs. frequency was incorrect when only two wavelengths were
specified and wavelength weighting was not uniform. Now corrected.
- In coating optimization, the program crashed if the number of
coating optimization targets was >100. Now fixed.
- Through-focus geometric MTF window caused a program crash if the
window was resized.
- Coating material editor did not accept data for the first private
- In transmission analysis, output of surface contribution now
takes orientation of input polarization into account.
Previously only the average value of S- and P-components
- Relative irradiance (RIRR) calculations now
correctly include transmission effects which may be caused by bulk absorption
or reflection losses.
- RAD (radial energy) is now correctly returned as database item (LDI).
- IC command added.
Allows selection of alternate intersection of rays with a surface.
- Code V import/export: IC command is now recognized.
- PSF: Gray level and false colour plots were improperly placed
for NRD > 32. Now corrected.
- Glasses from ArcherOpTx are now fully integrated in OpTaliX
- DO/ENDDO constructs in macros were not properly executed. This bug was erroneously
re-introduced and affected versions 6.02 to 6.05 only.
- Accuracy of diffraction MTF calculation has been significantly
improved for sparse sampling of the pupil (NRD < 32).
- The dialog for editing optimization variables/targets is now
modeless, that is, it can stay permanently opened. This allows
faster access to optimization variables/targets without blocking
other analysis or editing options.
- For consistency reasons, the defocus term is now defined by "THI si"
throughout the program. The previously used term "DEF" is now
obsolete, though still supported for backwards compatibility.
- Extensions to Code V import/export:
- PIM and THI si relationship now works reliably. This ensures
correct position of image plane during file conversions.
- field colours are now only exported if they were explicitly
- PUI, PUX, PUY, MRD are now correctly imported/exported.
- Extensions to Zemax import/export:
- GRIN profiles from Gradient Lens Corp. (GLC) are now correctly
- The ability to specify a reduction ratio for lens modules has been
added (see MRD command).
- Coating optimization targets can now inserted, deleted and sorted.
- Exporting RGB-images to BMP,PCX and PNG now correctly renders colour depth (24 bit).
- Environmental analysis with material pickup caused the program to
crash. Now fixed.
- Corrected Code V controls KC, AC, BC, CC, DC, EC, FC, GC, HC.
- Corrected parsing error on GLP command.
- Improved processing speed of $variables in macros.
- A subset of Code V control codes to define optimization variables are
now imported and exported. The recognized control codes are:
THC, CCY, CCX, KCC, ACC, BCC, CCC, DCC, ECC, FCC, GCC, HCC, XDC,
YDC, ZDC, ADC, BDC, CDC, GLC.
- DISX was not accessible as lens database item (LDI). Corrected.
- Third-order aberrations did not accept "zk" qualifiers. Now corrected.
- Attaching coatings to surfaces caused the program to crash. Now repaired.
- CLS command issued error messages even though syntax was correct. Now repaired.
- Long values entered into editor cells are now parsed correctly again.
Previously numeric input was truncated after 11 characters.
- Negative scaling factors for spot and fan plots caused a reversal
of aberration display. Now corrected.
- The program crashed if PSF TRU option was called with only a single
- Glass boundaries (GLP) are now saved with lens data.
- Principal plane locations are now available as database items
by SH1,SH2 commands.
- The size of markers used in spot diagrams is now adjustable via the
SPMS command. The size can also be globally defined in the preferences
section (miscellaneous tab).
Summarizes history of obsolete versions 5.xx
Summarizes history of obsolete versions 4.xx